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| − | [[File:emcubePAGE.png|thumb|450px]] | + | [[Image:NEOWEB4.png|thumb|600px|The NeoScan turnkey field measurement system.]] |
| − | <strong><font color="#07417e" size="4">NON-INVASIVE TURNKEY FIELD MEASUREMENT SYSTEM </font></strong> | + | <strong><font color="#707983" size="4">''CAPTURE THE INVISIBLE''</font></strong> |
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| − | '''Welcome to NeoScan Wiki!'''
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| − | [[Image:Back_icon.png|40px]] '''[[Main_Page | Back to Emagtech Wiki Gateway]]'''
| + | '''Welcome to [[NeoScan]] Wiki!''' |
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| − | EMAG Technologies Inc. offers the NeoScan family of turnkey field measurement systems. NeoScan systems utilize our unique, patented, electro-optic and magneto-optic probe technologies to detect, sample, measure and scan electric and magnetic fields in a non-invasive manner, while providing a very large operational bandwidth and a very high spatial resolution. NeoScan systems can be used for a variety of RF test and evaluation applications:
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| | + | [[image:NeoScan-ico.png | link=NeoScan]] |
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| | + | <strong><font color="#707983" size="3"> INTRODUCING THE FIRST</font></strong> <br /> |
| | + | <strong><font color="#07417e" size="4"> NON-INVASIVE, HIGH-RESOLUTION, ULTRA-WIDEBAND </font></strong> <br /> |
| | + | <strong><font color="#07417e" size="4"> TURNKEY FIELD MEASUREMENT SYSTEM </font></strong> |
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| − | <ul>
| + | * [[NoeScan: Product Overview]] |
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| + | * [[NeoScan System Applications]] |
| − | Non-invasive near-field mapping of RF devices, circuits and antennas</li>
| + | * [[NeoScan Probe Technology]] |
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| + | * [[Non-Invasive Near-Field Scanning Using NeoScan]] |
| − | System fault diagnostics through measurement of field emissions, leakage, coupling effects, etc.</li>
| + | * [[NeoScan for Antenna Characterization]] |
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| + | * [[NeoScan for Real-Time Waveform Probing]] |
| − | Compact near-field antenna range measurements</li>
| + | * [[NeoScan Video Gallery]] |
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| − | Real time non-contact measurement of fields and signals in a variety of propagation media</li>
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| − | </ul>
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| − | NeoScan systems can be customized to meet your most demanding test and evaluation requirements or adapted for various unconventional types of RF measurements. At the present time, EMAG Technologies offers the following four turnkey NeoScan system configurations:
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| − | <b>NeoScan - MSR</b>: Basic NeoScan Field Measurement System.</li>
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| − | <b>NeoScan - MAP</b>: NeoScan Field Mapping System.</li>
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| − | <b>NeoScan - ANT</b>: NeoScan Compact Antenna Characterization System.</li>
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| − | <li>
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| − | <b>NeoScan - DET</b>: NeoScan Real-Time Field Detection & Capture System.</li>
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| − | </ul>
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| | + | [[image:Cube-icon.png | link=EM.Cube]] '''[[EM.Cube | Visit EM.Cube Wiki Site]]''' |
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| − | == Our Goal: Helping You Better Solve Your RF Test & Characterization Problems Through Innovation== | + | [[image:RFSpice-ico.png | link=RF.Spice A/D]] '''[[RF.Spice A/D | Visit RF.Spice A/D Wiki Site]]''' |
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| − | At the Opteos Division of EMAG Technologies Inc. we offer a wide range of RF field probes, detection sensors and near field scanning systems for direct measurement of electric and magnetic fields. Our product offering ranges from custom electric and magnetic field probes to turnkey field measurement systems complete with the supporting electronics, translation stages, control software, and post-processing tools for measured field data. Our systems can be customized to meet your particular measurement needs with regard to sensitivity, spatial resolution, instantaneous bandwidth, test medium, ruggedized packaging requirements, etc. Please contact us to discuss your measurement requirements. Our engineers will recommend a system configuration that will best suit your measurement needs and budget.
| + | [[Image:Back_icon.png|40px]] '''[[Main_Page | Back to Emagtech Wiki Gateway]]''' |
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| − | == Product Overview ==
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| − | NeoScan® is a turnkey, electric or magnetic field measurement system. NeoScan systems utilize EMAG's unique, patented, electro-optic (EO) or magneto-optic (MO) field probe technologies. The basic NeoScan system configuration (NeoScan - MSR) uses a non-invasive optical fiber probe to sample and measure the ambient field present at the probe's head. The optical beam from a laser source passes through the optical crystal at the probe head, and its polarization state is modulated by the high frequency electric or magnetic field. The reflected optical beam then passes through an optical processing system and is demodulated. The modulating electric or magnetic field signal is detected by a high frequency photodetector.
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| − | In addition to basic field measurement at fixed points in space, NeoScan can also be configured as a near-field scanning system for mapping aperture-level or device-level field distributions with minimal invasiveness to the antenna or device under test. Or it can be used as a real-time field detection system for sensing and detecting electric and magnetic fields in a variety of physical propagation media.
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| − | Unlike conventional near-field scanning systems that utilize metallic radiators to pick up the fields, NeoScan probes are absolutely non-metallic, and their operation is based on electro-optic (EO) or magneto-optic (MO) effects. Our field probes feature extremely small EO or MO crystals mounted at the tip of an optical fiber. The combination of small probe size and absence of metallic parts thus leads to the ultimate RF non-invasiveness.
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| − | NeoScan provides detailed field maps of passive and active devices and circuits including RFIC's and MMIC's. Such invaluable information can effectively be used for design validation, model verification, fault isolation or performance evaluation of various parts of your RF system.
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| − | == A Unique Test & Evaluation Capability ==
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| − | Some of the key features of NeoScan field measurement systems include:
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| − | • Non-intrusive and non-contact RF measurement thanks to the small footprint and absence of any metal parts or interconnnects at the signal pickup area
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| − | • Broad measurement bandwidth (>20GHz) using the same optical probes
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| − | • High spatial resolution driven by the laser beam spot size (finer than 100 μm sq)
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| − | • Simultaneous amplitude and phase measurement
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| − | • Vectorial field measurement with very high cross-polarization suppression
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| − | • Very wide dynamic range (>70dB) from very low field intensities under 1V/m to extremely high field intensities above 2MV/m
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| − | == Understanding Your RF Design Through Field Maps ==
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| − | Measurement of electric and magnetic fields has numerous uses and applications in different areas of RF technology. First and foremost, field maps shed light on the physical behavior of RF devices and systems. RF engineers typically use external measurement systems for high frequency characterization. For example, a network analyzer measures the port characteristics of a device. Antennas are usually characterized by their far field radiation patterns. Such external measurements do not reveal much about how signals, fields and waves evolve, build up and propagate inside a device from one port to another, or out into the free space. Just as an oscilloscope probe measures voltages and currents at various points of an electronic circuit, imagine if you could measure electric or magnetic fields at any point inside or around a distributed RF system! That's what NeoScan exactly does for you.
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| − | == Non-Invasive Ultra-Near-Field Scanning ==
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| − | One of the most unique features of the NeoScan system is the very small size of its field probes and the absence of any metallic parts at the probe tip. As a result, you can position a NeoScan field probe very close to the device under test without perturbing the ambient electric or magnetic fields. When mounted on a computer-controlled XY positioner, the probe can scan the surface of your device and create a field map in real time. You can generate maps of the tangential and normal components of the field displaying the amplitude and phase of the respective field components at all the scanned points.
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| − | == Verification & Validation of Simulation vs. Measurement ==
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| − | Users of electromagnetic simulation tools often ask a critical question: "How do I know if my simulation results are right and represent the reality?" The primary solutions of most electromagnetic solvers are electric and/or magnetic fields in the given computational domain. All the secondary quantities such as the S/Z/Y parameters, radiation patterns and other characteristics are derived from the primary field quantities. In a similar vein, NeoScan field probes and scanning systems measure the actual electric and magnetic fields at a given point or on a specified surface.
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| − | Using these measured field profiles, one can compute all the other secondary quantities of interest. You can use our field maps as an effective means of verification and validation (V&V) of your modeling and simulation tools. Similarly, you can use our electromagnetic analysis tools to verify and validate the field measurement results.
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| − | == A Low-Cost Alternative to Costly Anechoic Chambers and Much More... ==
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| − | NeoScan systems can be used as an essential tool for characterization, test and evaluation of antennas and phased array systems. The radiation patterns of antennas and arrays are traditionally measured in anechoic chambers. The size of the chamber, its architecture and the quality of the surrounding absorbers all affect the chamber's frequency range of operation and the accuracy of the measured results. Anechoic chamber facilities are very expensive, require a large space and are hard to operate and maintain. Compact near-field ranges are smaller replacements for full-sized chambers.
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| − | Near-field scanning systems are by far the most compact alternatives for antenna pattern measurement. Yet, conventional near-field scanning systems have substantial downsides. These systems involve metallic radiators that act as receivers for picking up the near field of the antenna under test (AUT). Such metallic pick-up antennas cannot get close to the AUT since they would perturb its near fields. They also limit the operational bandwidth of the system, and their accuracy degrades significantly at lower frequency bands. Sophisticated software tools are often used in conjunction with these systems to de-embed and minimize various errors due to their specific architectures and configurations.
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| − | == NeoScan vs. Conventional Near-Field Scanning Systems ==
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| − | The NeoScan system provides a unique and highly superior alternative to the conventional near-field scanning systems. The NeoScan probes are optical and have absolutely non-metallic compositions. They are extremely small, can get very close to the surface of the radiating aperture, and provide ultra-wideband operation. Due to their non-invasive nature, NeoScan probes can generate ultra-near-field scans of the AUT. These can be used as an invaluable tool for diagnostic purposes. For instance, you can examine the inter-element coupling effects in passive and active phased arrays.
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| − | The NeoScan - ANT system comes with an operational software that quickly determines the optimal distance of the probe from the radiating aperture for the fastest scan. The radiation pattern of the AUT is readily computed using a rigorous near-to-far-field transformation without any need for eliminating artifact errors. This is due to the fact that NeoScan measures the "true" near fields of the AUT without any external perturbations.
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| − | In short, with NeoScan, you get a compact portable self-contained system that characterizes your antenna system from the very near fields to the very far fields without requiring considerable real estate. NeoScan is particularly useful for phase characterization and calibration large antenna arrays.
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| − | == NeoScan: The Perfect Non-Invasive Solution for Diagnostics of High-Power Antenna Systems ==
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| − | Characterization of high-power active phased arrays is a very challenging task. Special considerations must be taken into account when measuring high-power antenna systems in an anechoic chamber including operator's safety. NeoScan probes can handle field intensities as large as 2MV/m and can even withstand higher radiated power levels. EMAG's unique probe and optical processing technology allows standoff distances as long as 50 meters between the probe location at the aperture of the high-power array and the optical mainframe and processing unit. This enables you to readily characterize very high-power antenna systems very accurately in a totally non-invasive manner without any serious safety or logistic concerns.
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| − | == A Unique Technology for Real-Time Detection of Transient Fields & Signals ==
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| − | EMAG Technologies Inc. utilizes a novel patented technology for real-time measurement of electric and magnetic fields. EO and MO modulation effects provide a unique means of sensing and detecting wideband RF and microwave signals in real time. Since the carrier signal is at optical frequencies, the modulating RF field can have substantial bandwidths.
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| − | Our probe systems can be used as an instrument for real-time measurement of wideband RF signals in microwave circuits and systems. They can also be utilized in a unique way for a variety of other detection and sensing applications where the presence of metallic parts is highly undesirable such as directed energy and high power microwave systems. Using a robust, patented, optical processing technology, the probes can have standoff distances up to 50 meters from the physical location of the optical mainframe system.
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| − | NeoScan systmes can be configured in multi-channel architectures for simultaneous field measurements at multiple points and locations. Different channels can measure different polarizations in a totally coherent manner.
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