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EM.Picasso

1,677 bytes added, 14:00, 15 May 2017
/* Discretizing a Planar Structure in EM.Picasso */
[[EM.Picasso]] provides two types of mesh for a planar structure: a pure triangular surface mesh and a hybrid triangular-rectangular surface mesh. In both case, [[EM.Picasso]] attempts to create a highly regular mesh, in which most of the cells have almost equal areas. For planar structures with regular, mostly rectangular shapes, the hybrid mesh generator usually leads to faster computation times.
 
 
[[Image:Info_icon.png|30px]] Click here to learn more about [[EM.Picasso]]'s '''[[Mesh_Generation_Schemes_in_EM.Cube#The_Hybrid_Planar_Mesh_Generator | Hybrid Planar Mesh Generator]]'''.
[[Image:Info_icon.png|30px]] Click here to learn more about [[EM.Picasso]]'s '''[[Preparing_Physical_Structures_for_Electromagnetic_Simulation#The_Triangular_Surface_Mesh_Generator | Triangular Surface Mesh Generator]]'''.
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<td> [[Image:PMOM48H.png|thumb|left|420px|Details of the hybrid planar mesh of the slot-coupled patch array around discontinuities.]] </td>
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=== The Hybrid Planar Mesh Generator ===
 
[[EM.Picasso]]'s hybrid planar mesh generator tries to produce as many rectangular cells as possible especially in the case of objects with rectangular or linear boundaries. In connection or junction areas between adjacent objects or close to highly curved boundaries, triangular cells are used to fill the "irregular" regions in a conformal and consistent manner.
 
The mesh density gives a measure of the number of cells per effective wavelength that are placed in various regions of your planar structure. The effective wavelength is defined as <math>\lambda_{eff} = \tfrac{\lambda_0}{\sqrt{\varepsilon_{eff}}}</math>, where e<sub>eff</sub> is the effective permittivity. By default, [[EM.Picasso]] generates a hybrid mesh with a mesh density of 20 cells per effective wavelength. The effective permittivity is defined differently for different types of traces and embedded object sets. This is to make sure that enough cells are placed in areas that might feature higher field concentration.
 
* For PEC and conductive sheet traces, the effective permittivity is defined as the larger of the permittivity of the two substrate layers just above and below the metallic trace.
* For slot traces, the effective permittivity is defined as the mean (average) of the permittivity of the two substrate layers just above and below the metallic trace.
* For embedded object sets, the effective permittivity is defined as the largest of the permittivities of all the substrate layers and embedded dielectric sets.
 
<table>
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<td> [[Image:PMOM32.png|thumb|360px|A comparison of triangular and planar hybrid meshes of a rectangular patch.]] </td>
<td> [[Image:PMOM30.png|thumb|360px|Mesh of two rectangular patches at two different substrate planes. The lower substrate layer has a higher permittivity.]] </td>
</tr>
</table>
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