NeoScan
NON-INVASIVE TURNKEY FIELD MEASUREMENT SYSTEM
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Contents
Introducing NeoScan
EMAG Technologies Inc. offers unique, innovative and versatile solutions for your RF test and characterization needs. The NeoScan family of turnkey field measurement systems provide a non-invasive method to detect and probe the electric and magnetic fields generated by your RF devices, antennas or subsystems. They utilize our patented electro-optic and magneto-optic probe technologies to sample and measure electric and magnetic fields without any physical contact, while providing a very large operational bandwidth and a very high spatial resolution.
Unlike conventional near-field scanning systems that require metallic radiators or sensors to pick up the fields, NeoScan probes are made of absolutely non-metallic parts. Our field probes feature extremely small optical crystals mounted at the tip of an optical fiber. The combination of small probe footprint and absence of metallic parts or interconnnects at the signal pickup area leads to the ultimate RF non-invasiveness. In addition to fixed-point field sampling, a NeoScan system can also be configured as a near-field scanning system for mapping aperture-level or device-level field distributions with minimal invasiveness to the antenna or device under test. Or it can be used as a real-time field detection system for sensing and detecting electric and magnetic fields in a variety of physical propagation media.
Some of the key features of NeoScan field measurement systems include:
- Non-intrusive and non-contact RF measurement
- Broad measurement bandwidth (20MHz - 20GHz) using the same optical probes
- Simultaneous amplitude and phase measurement
- Vectorial component measurement with cross polarization suppression better than 20dB
- Very wide dynamic range (>70dB) from very low field intensities under 1V/m to extremely high field intensities above 2MV/m using the same optical probes
- Typical probe tip size: 1mm3
- High spatial resolution driven by the laser beam spot size (finer than 10 μm in diameter) with scan steps as small as 100μm
- DUT proximity: As close as 150μm
- Standoff distance (of mainframe box): Up to 50m
NeoScan systems can be used for a variety of RF test and evaluation applications:
- Non-invasive near-field mapping of RF devices, circuits and antennas
- System fault diagnostics through measurement of field emissions, leakage, coupling effects, etc.
- Compact near-field antenna range measurements
- Real time non-contact measurement of fields and signals in a variety of propagation media
Product Overview
NeoScan Technology
NeoScan Applications
NeoScan for Antenna Characterization
