Difference between revisions of "NeoScan"

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[[Image:NEOWEB4.png|thumb|600px|The NeoScan turnkey field measurement system.]]
 
[[Image:NEOWEB4.png|thumb|600px|The NeoScan turnkey field measurement system.]]
<strong><font color="#07417e" size="4">NON-INVASIVE TURNKEY FIELD MEASUREMENT SYSTEM </font></strong>
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<strong><font color="#707983" size="4">''CAPTURE THE INVISIBLE''</font></strong>
  
'''Welcome to NeoScan Wiki!'''
 
 
[[Image:Back_icon.png|40px]] '''[[Main_Page | Back to Emagtech Wiki Gateway]]'''
 
 
== Introducing NeoScan: Product Overview ==
 
 
EMAG Technologies Inc. offers unique, versatile solutions for your RF test and characterization needs. The NeoScan family of turnkey field measurement systems provide a non-invasive method to detect and probe the electric and magnetic fields generated by your RF devices, antennas or subsystems. They utilize our patented electro-optic and magneto-optic probe technologies to sample and measure electric and magnetic fields without any physical contact, while providing a very large operational bandwidth and a very high spatial resolution.
 
 
Unlike conventional near-field scanning systems that require metallic pickup radiators or sensors, NeoScan probes are made of absolutely metal-free parts. Our field probes feature miniaturized optical crystal tips mounted on optical fibers. The combination of extremely small probe footprint and absence of metallic parts or interconnnects at the signal pickup area warrant the ultimate RF non-invasiveness. In addition to local field sampling, a NeoScan system can be configured as a near-field scanning system for mapping aperture-level or device-level field distributions with minimal invasiveness to the antenna or device under test. You can also use a NeoScan system as a real-time field detection system for sensing and probing electric and magnetic field waveforms in a variety of physical propagation media.
 
 
 
NeoScan systems can be used for a variety of RF test and evaluation applications:
 
 
<ul>
 
<li>
 
Non-invasive near-field mapping of RF devices, circuits and antennas</li>
 
<li>
 
System fault diagnostics through measurement of field emissions, leakage, coupling effects, etc.</li>
 
<li>
 
Compact near-field antenna range measurements</li>
 
<li>
 
Real time non-contact measurement of fields and signals in a variety of propagation media</li>
 
</ul>
 
 
 
== Key System Features ==
 
{{#ev:youtube|https://www.youtube.com/watch?v=b2Aqrfdrm_E|400|right|A Brief Overview of the NeoScan System.|frame}}
 
Some of the key features of NeoScan field measurement systems include:
 
 
*Non-intrusive and non-contact RF measurement
 
*Broad measurement bandwidth (20MHz - 20GHz) using the same optical probes
 
*Simultaneous amplitude and phase measurement
 
*Vectorial component measurement with cross polarization suppression better than 20dB
 
*Very wide dynamic range (>70dB) from very low field intensities under 1V/m to extremely high field intensities above 2MV/m using the same optical probes
 
*Typical probe tip size: 1mm<sup>3</sup>
 
*High spatial resolution driven by the laser beam spot size (finer than 10 μm in diameter) with scan steps as small as 100&mu;m
 
*DUT proximity: As close as 150&mu;m
 
*Standoff distance (of mainframe box): Up to 50m
 
 
 
== Customized System Configurations ==
 
 
NeoScan systems can be fully customized to meet your most demanding test and evaluation requirements or adapted for various unconventional types of RF measurements. At the present time, EMAG Technologies offers the following four turnkey NeoScan system configurations:
 
 
<ul>
 
<li>
 
<b>[[NeoScan]] - MSR</b>: Basic NeoScan Field Measurement System</li>
 
<li>
 
<b>[[NeoScan]] - MAP</b>: NeoScan Field Mapping System</li>
 
<li>
 
<b>[[NeoScan]] - ANT</b>: NeoScan Compact Antenna Characterization System</li>
 
<li>
 
<b>[[NeoScan]] - DET</b>: NeoScan Real-Time Field Detection &amp; Capture System</li>
 
</ul>
 
  
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'''Welcome to [[NeoScan]] Wiki!'''
  
 
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[[Image:NEOWEB1.png|thumb|360px|The front view of the NeoScan system mainframe.]]
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[[image:NeoScan-ico.png | link=NeoScan]]  
 
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[[Image:NEOWEB23.png|thumb|360px|The rear view of the NeoScan system mainframe.]]
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<strong><font color="#707983" size="3">&nbsp; INTRODUCING THE FIRST</font></strong> <br />
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<strong><font color="#07417e" size="4">&nbsp; NON-INVASIVE, HIGH-RESOLUTION, ULTRA-WIDEBAND </font></strong> <br />
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<strong><font color="#07417e" size="4">&nbsp; TURNKEY FIELD MEASUREMENT SYSTEM </font></strong>
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[[Image:NEOWEB5.png|thumb|360px|The NeoScan optical field probe mounted on a precision XY translation stage.]]
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[[Image:NEOWEB17.png|thumb|360px|Measuring the aperture fields of a 16GHz standard horn antenna using NeoScan.]]
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* [[NoeScan: Product Overview]]
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* [[NeoScan System Applications]]
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* [[NeoScan Probe Technology]]
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* [[Non-Invasive Near-Field Scanning Using NeoScan]]
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* [[NeoScan for Antenna Characterization]]
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* [[NeoScan for Real-Time Waveform Probing]]
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* [[NeoScan Video Gallery]]
  
== NeoScan Probe Technology ==
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<br />
  
=== The Electro-Optic Effect ===
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<hr>
  
[[Image:NEOWEB2.png|thumb|420px|Modulating the polarization state of an optical beam passing through an electro-optic crystal.]]
 
The operation of the NeoScan system is based on the Pockels electro-optic effect, which predicts the phase retardation and change of the polarization state of an optical beam in an electro-optic (EO) crystal due to an impinging electric field. This effect is observed in non-centrosymmetric crystals when an electric field directed along certain crystal axes causes a change in the indices of refraction encountered by an incident optical beam. The electro-optic effect provides a means of modulating the phase or intensity of the optical radiation. It also makes it possible to detect the presence of an electric field impinging on an EO crystal. The polarization state of an optical beam travelling through an EO crystal is altered by the electric field in that crystal. A comparison of the original polarization states of the optical beam before and after interacting with the crystal allows a determination of the amplitude and phase of the impinging RF electric field. Since the electro-optic sensing phenomenon relies on small displacements of the atomic crystal structure, the response time of the process is extremely short. This short response time makes it possible to measure high-frequency electric fields up to the terahertz regime.
 
  
=== NeoScan Electro-Optic Field Probes ===
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[[image:Cube-icon.png | link=EM.Cube]] &nbsp; '''[[EM.Cube | Visit EM.Cube Wiki Site]]'''
 
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A typical EO probe is composed of an optical fiber affixed with an EO crystal, whose bottom surface is coated with a dielectric reflective layer. A low-noise 1550nm laser is used as the optical beam source. The beam is delivered to the optical probe through a fiber-based optical mainframe. The polarization of the beam is modulated by the electric field penetrating the EO crystal tip. The modulated beam is reflected back into the fiber, and back to the mainframe for analysis. The intensity of the output optical beam is linearly proportional to the strength of the external electric field at the probe tip location. This is then converted to an output RF signal by a high-speed photodetector.
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Unlike the conventional electric field measurement techniques which require some type of resonant metal structure to detect an RF signal, NeoScan’s unique EO probe requires no metal components. As a result, the field perturbation caused by introducing the probe tip within the vicinity of a device under test (DUT) is significantly reduced. With its broad measurement bandwidth and high spatial resolution, NeoScan privides the EO measurement technique is a promising means to characterize RF systems such as microwave and millimeter-wave integrated circuits and antennas.
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NeoScan field probes are supplied with polarization maintaining (PM) fibers of certain lengths. The end of the fiber is connected to the NeoScan optical mainframe using an FC/APC fiber connector. Since [[NeoScan]]'s underlying principle of operation is based on the polarization modulation of an optical beam, the use of PM fiber plays a critical role in maintaining the integrity of the sampled field data. Our standard field probes come with fiber lengths of 10m, 20m and 50m. A large standoff distance allows you to place the probe far away from the optical mainframe. This is a significant advantage for probing high power microwave systems or for near-field scanning of high power transmitting phased array antennas.       
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=== Measuring Amplitude and Phase of Polarimetric Fields ===
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Figure 1.3 shows the electric and magnetic fields distribution of a traveling RF wave with a normal probe shown in typical orientation. To detect the maximum electric field in this configuration, the propagation direction of the optical beam of the probe should be parallel to the E-field direction. In general, a normal EO probe is only sensitive to the electric field component parallel to the probe handle, whereas a tangential probe is sensitive to the electric field component perpendicular to the probe handle. Yet, the E-field sensitivity of a tangential probe depends on its crystal orientation sitting on its tip.
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The [[NeoScan]] system is capable of measuring signals with bandwidths up to 20 GHz and signal levels as low as 1 V/m for optical probes with a 10 m PM fiber. Because the optical probes are free of metallic parts, it is possible to measure extremely high-field strengths since there are no free electron surfaces to generate arcing. The NeoScan can measure fields up at least 2 MV/m and possibly higher.
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[[Image:NEOWEB35.png|thumb|390px|A NeoScan field probe with a 10m PM fiber and an FC/APC connector.]]
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[[Image:NEOWEB36.png|thumb|330px|A NeoScan field probe measuring the fields on the surface of a CPW thru line.]]
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== NeoScan System Applications ==
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[[Image:NEOWEB18.png|thumb|400px|Measuring the field maps of a planar microstrip bandpass filter in and out of its passband.]]
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=== Why Measure Fields? ===
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Measurement of electric and magnetic fields has numerous uses and applications in different areas of RF technology. First and foremost, field maps shed light on the physical behavior of RF devices and systems. RF engineers typically use external measurement systems for high frequency characterization. For example, a network analyzer measures the port characteristics of a device. Antennas are usually characterized by their far field radiation patterns. Such external measurements do not reveal much about how signals, fields and waves evolve, build up and propagate inside a device from one port to another, or out into the free space.
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Just as an oscilloscope probe measures voltages and currents at various points of an electronic circuit, imagine if you could measure electric or magnetic fields at any point inside or around a distributed RF system without perturbing them! That's what [[NeoScan]] exactly does for you.
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=== What Can You Use the NeoScan System For? ===
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{{#ev:youtube|https://www.youtube.com/watch?v=l9xrzP6XP2g|400|right|Characterizing an S-band microstrip-fed patch antenna.|frame}}
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The following are a few examples of how you can use the [[NeoScan]] system to measure electric fields in a variety of applications:
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*High-Resolution Near-Field Scanning
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*RF Test & Characterization
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*Compact Antenna Range Alternative
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*RF Circuit & Device Diagnostics
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*Phase Calibration of AESA Arrays
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*Real-time Field Detection
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*EMC/EMI Testing & Certification
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*Ultra-wideband Pulse Waveform Probing
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*High-Power Microwave System Evaluation
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*Field Monitoring in Medical Devices and Biological Environments
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*Non-Contact, Non-Invasive, Remote Field Sensing & Evaluation
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*Model Verification & Validation (V&V)
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Follow the links below to find out how a NeoScan system can solve your RF test and characterization needs:
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[[Non-Invasive Near-Field Scanning]]
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[[NeoScan for Antenna Characterization]]
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[[NeoScan for Real-Time Waveform Probing]]
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<hr>
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Latest revision as of 13:11, 3 October 2016

The NeoScan turnkey field measurement system.

CAPTURE THE INVISIBLE


Welcome to NeoScan Wiki!

NeoScan-ico.png

  INTRODUCING THE FIRST
  NON-INVASIVE, HIGH-RESOLUTION, ULTRA-WIDEBAND
  TURNKEY FIELD MEASUREMENT SYSTEM




Cube-icon.png   Visit EM.Cube Wiki Site

RFSpice-ico.png   Visit RF.Spice A/D Wiki Site

Back icon.png Back to Emagtech Wiki Gateway