[[NeoScan]] provides detailed field maps of passive and active devices and circuits including RFICâs and MMICâs. Such invaluable information can effectively be used for design validation, model verification, diagnostics and fault isolation or performance evaluation of various parts of RF systems. It is also an alternative compact range for measurement of far-field radiation patterns of antennas and arrays, dispensing with a costly anechoic chamber. The system can be used in real-time, polarimetric and coherent sensing and probing of wideband signals and pulses, EMC/EMI testing, and medical device measurements and characterization of biological environments. The [[NeoScan]] system can be configured in a multi-channel architecture for simultaneous field measurement at multiple points and locations. Different channels can measure different polarizations in a coherent manner.
1.2 == Features of the [[NeoScan]] System==
Wideband operational bandwidth: few MHz to 20GHz, measuring repetitive signals with 50-ps rise time, 10-ns duration, and 80 V/m amplitude with a 10% to 90% definition
System Operation, Monitoring, and Optimization Software
1.3 == General Description==
The [[NeoScan]] real-time field measurement & scanning system provides an entirely new capability for the measurement of high-intensity electric fields. This technology is based on the Pockelâs effect which measures the phase-retardance of an optical beam due to an impinging electric field. This electro-optic effect is observed in non-centrosymmetric crystals when an electric field is directed along certain crystal axes causes a change in the indices of refraction encountered by an incident optical beam. Figure 1.1 shows the basic principle of the electro-optic effect. The electro-optic effect provides a means of modulating the phase or intensity of the optical radiation. In another sense, this effect also makes it possible to detect the presence of an electric field impinging on the crystal. The polarization of an optical beam travelling through a crystal is altered by the electric field in that crystal. The comparison of polarization states allows determination of the amplitude and phase of the existing RF electric field. Since the electro-optic sensing phenomenon relies on small displacements of the atomic crystal structure, the response time of the process is extremely short. This short response time makes it possible to measure high-frequency electric fields up to the terahertz regime.