The NeoScan system is capable of measuring signals with bandwidths up to 20 GHz and signal levels as low as 1 V/m for optical probes with a 10 m PM fiber. Because the optical probes are free of metallic parts, it is possible to measure extremely high-field strengths since there are no free electron surfaces to generate arcing. The NeoScan can measure fields up at least 2 MV/m and possibly higher.
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== Verification & Validation of Simulation vs. Measurement ==
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Users of electromagnetic simulation tools often ask a critical question: "How do I know if my simulation results are right and represent the reality?" The primary solutions of most electromagnetic solvers are electric and/or magnetic fields in the given computational domain. All the secondary quantities such as the S/Z/Y parameters, radiation patterns and other characteristics are derived from the primary field quantities. In a similar vein, NeoScan field probes and scanning systems measure the actual electric and magnetic fields at a given point or on a specified surface.
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Using these measured field profiles, one can compute all the other secondary quantities of interest. You can use our field maps as an effective means of verification and validation (V&V) of your modeling and simulation tools. Similarly, you can use our electromagnetic analysis tools to verify and validate the field measurement results.
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<table>
<tr>
<td>
[[Image:NEOWEB19.png|thumb|720px|Modulating the polarization state of an optical beam passing through an electro-optic crystal.]]
</td>
</tr>
</table>
== Understanding Your RF Design Through Field Maps ==
</tr>
</table>
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== NeoScan vs. Conventional Near-Field Scanning Systems ==
<td>
[[Image:NEOWEB21.png|thumb|550px|Modulating the polarization state of an optical beam passing through an electro-optic crystal.]]
</td>
</tr>
</table>
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== Verification & Validation of Simulation vs. Measurement ==
Â
Users of electromagnetic simulation tools often ask a critical question: "How do I know if my simulation results are right and represent the reality?" The primary solutions of most electromagnetic solvers are electric and/or magnetic fields in the given computational domain. All the secondary quantities such as the S/Z/Y parameters, radiation patterns and other characteristics are derived from the primary field quantities. In a similar vein, NeoScan field probes and scanning systems measure the actual electric and magnetic fields at a given point or on a specified surface.
Â
Using these measured field profiles, one can compute all the other secondary quantities of interest. You can use our field maps as an effective means of verification and validation (V&V) of your modeling and simulation tools. Similarly, you can use our electromagnetic analysis tools to verify and validate the field measurement results.
Â
<table>
<tr>
<td>
[[Image:NEOWEB19.png|thumb|720px|Modulating the polarization state of an optical beam passing through an electro-optic crystal.]]
</td>
</tr>
</table>