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Analyzing Circuits Using Predefined Tests

0 bytes added, 21:00, 19 August 2015
/* Generating Characteristic v-i Curves for Active Devices */
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[[File:b2MAN_Fig224.png|thumb|420px400px|The NPN-Type BJT curve tracer test circuit.]]
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[[File:b2MAN_Fig225.png|thumb|700px720px|The generated characteristic v-i curves for the generic NPN-Type BJT.]]
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Kazem Sabet
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