Changes

Analyzing Circuits Using Predefined Tests

84 bytes removed, 21:08, 10 November 2016

/* DC Sweep Test */

<table>

<tr>

<td> [[File:b2MAN_Fig47.png|thumb|left|250px|DC Sweep Test Settings.]]

</td>

~~<td> [[File:b2MAN_Fig50.png|thumb|left|250px|DC Sensitivity Test Settings.]]</td>~~</tr>

</table>

===Generating Characteristic v-i Curves for Active Devices===

28,333

edits