Changes

Analyzing Circuits Using Predefined Tests

76 bytes removed, 21:07, 10 November 2016
/* Generating Characteristic v-i Curves for Active Devices */
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[[File:b2MAN_Fig224.png|thumb|left|460px550px|The NPN-Type BJT curve tracer test circuit.]]
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[[File:b2MAN_Fig231.png|thumb|200px|The output of a DC Sensitivity Test.]]
===DC Sensitivity Test===
Kazem Sabet
28,333
edits