Changes

One of the most unique features of the [[NeoScan]] system is the very small size of its field probes and the absence of any metallic parts at the probe tip. As a result, you can position a [[NeoScan]] field probe very close to the device under test (DUT) without perturbing the ambient electric or magnetic fields. In addition to the very small footprint of the EO probe, its true spatial resolution is driven by the spot size of its laser beam, which is less than 10&mu;m. These aspects of the [[NeoScan]] system, <i>i.e. </i> non-invasiveness and very high spatial resolution, are very critical for probing and characterizing the fields on the surface of microwave and millimeter wave active or passive devices.