Changes

NeoScan for Antenna Characterization

491 bytes added, 22:48, 27 January 2016
{{#ev:youtube|https://www.youtube.com/watch?v=oAa-XqE9H1g|550|right|<b>VIDEO</b>: Characterizing an X-band slotted waveguide array.| frame}}
 Characterization Test and evaluation of high-power antenna systems or active phased arrays is a very challenging taskdaunting process. Special considerations must be taken into account when measuring high-power antenna radiating systems in an anechoic chamber including operator's safetyand fire hazards. The problems are multiplied when using a near-field scanning system whose metallic receiver probe has to be positioned at a far enough distance from the transmitting antenna under test. In contrast, [[NeoScan]] probes can handle field intensities as large as 2MV/m and can even withstand higher radiated power levels. The non-invasive EO probes can be placed very close to the surface of the high-power radiating aperture, while the optical mainframe and RF processing back end reside much farther at a reliable distance from the aperture. EMAG's unique probe and optical processing technology utilizing polarization maintaining (PM) optical fibers allows standoff distances as long as 50 meters between the probe location at the aperture of the high-power array and the optical mainframe and processing unit. This enables you to readily characterize very high-power antenna systems very accurately in a totally non-invasive manner without any serious safety or logistic concerns.
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