Changes

The anisotropic nature of the EO probe tip allows accurate measurement of all the three components of the electric field with a high degree of polarization purity. The NeoScan system features both tangential and normal field probes. A normal EO probe is only sensitive to the electric field component parallel to the probe axis, whereas a tangential probe is sensitive to the electric field component perpendicular to the probe axis and parallel to the EO crystal orientation. By synchronizing its optical and RF signal processing system with the RF signal generator feeding the device under test (DUT), NeoScan is able to measure the relative phase of the electric field sampled by its probe very accurately. The current NeoScan system is capable of measuring signals with instantaneous bandwidths up to 20GHz and signal levels as low as 1V/m. Because the optical probes are completely free of metallic parts, there are no free electron surfaces to generate arcing. As a result, it is possible to measure extremely high field strengths up to 2MV/m or even higher using the same field probes.