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== Product Overview ==
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[[Image:NEOWEB4.png|thumb|600px|The NeoScan turnkey field measurement system.]]
EMAG Technologies Inc. offers the NeoScan family of turnkey field measurement systems. NeoScan systems utilize our unique, patented, electro-optic and magneto-optic probe technologies to detect, sample, measure and scan electric and magnetic fields in a non-invasive manner, while providing a very large operational bandwidth and a very high spatial resolution. NeoScan systems can be used for a variety of RF test and evaluation applications:
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== Our Goal: Helping You Better Solve Your RF Test & Characterization Problems Through Innovation==
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At the Opteos Division of EMAG Technologies Inc. we offer a wide range of RF field probes, detection sensors and near field scanning systems for direct measurement of electric and magnetic fields. Our product offering ranges from custom electric and magnetic field probes to turnkey field measurement systems complete with the supporting electronics, translation stages, control software, and post-processing tools for measured field data. Our systems can be customized to meet your particular measurement needs with regard to sensitivity, spatial resolution, instantaneous bandwidth, test medium, ruggedized packaging requirements, etc. Please contact us to discuss your measurement requirements. Our engineers will recommend a system configuration that will best suit your measurement needs and budget.
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== Product Overview ==
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[[Image:NEOWEB4.png|thumb|600px|The NeoScan turnkey field measurement system.]]
NeoScan® is a turnkey, electric or magnetic field measurement system. NeoScan systems utilize EMAG's unique, patented, electro-optic (EO) or magneto-optic (MO) field probe technologies. The basic NeoScan system configuration (NeoScan - MSR) uses a non-invasive optical fiber probe to sample and measure the ambient field present at the probe's head. The optical beam from a laser source passes through the optical crystal at the probe head, and its polarization state is modulated by the high frequency electric or magnetic field. The reflected optical beam then passes through an optical processing system and is demodulated. The modulating electric or magnetic field signal is detected by a high frequency photodetector.