===Generating Characteristic v-i Curves for Active Devices===
The most obvious sweep variable for a DC sweep test is the strength of your source, which can be either the input voltage or input current. This type of analysis is often used to generate the characteristic v-i curves of an active device like a BJT or MOSFET. To make life a little bit easier, [[B2RF.Spice A/D]] provides eleven template projects for the most commonly used active devices including diodes and transistors. These template project files are located in the "[[Tests]]" folder in your B2.Spice [[installation]] directory:
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[[File:b2MAN_Fig231.png|thumb|200px|The output of a DC Sensitivity Test.]]
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===DC Sensitivity Test===