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When mounted on a computer-controlled XY positioner, the probe can scan the surface of your device and create a field map in real time. You can generate maps of the tangential and normal components of the field displaying the amplitude and phase of the respective field components over the entire scanned area. The turnkey [[NeoScan]] systems system comes with a precision computer-controlled XY translation stage and probe holder fixture. A visual software interface allows you to easily set up the scan area and run a near -field scan, or control the probe motion at your discretion point to point. You can observe and monitor the evolution of the field maps on the screen as the probe step through the designated scan surface. At the end of a field scan, you can save, plot and manipulate the collected field data.
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Using these measured field profiles, one can compute all the other secondary quantities of interest. You can use the [[NeoScan]] field maps as an effective means of verification and validation (V&V) of your modeling and simulation tools. Similarly, you can use our electromagnetic analysis tools such as [[EM.Cube]] to verify and validate the field measurement results.
Click here to read a web article entitled "'''[httphttps://www.emagtech.com/content/using-emcube-and-neoscan-system-together-antenna-design Using EM.Cube and NeoScan System Together for Antenna Design]'''" describing an extensive V&V case study.
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