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== Introducing NeoScan ==
EMAG Technologies Inc. offers unique, versatile solutions for your RF test and characterization needs. The [[NeoScan]] family of turnkey field measurement systems provide provides a non-invasive method to detect and probe the electric and magnetic fields generated by your RF devices, antennas or subsystems. They utilize our patented electro-optic and magneto-optic probe technologies to sample and measure electric and magnetic fields without any physical contact, while providing a very large operational bandwidth and a very high spatial resolution.
Unlike conventional near-field scanning systems that require metallic pickup radiators or sensors, [[NeoScan]] probes are made of absolutely metal-free parts. Our field probes feature miniaturized optical crystal tips mounted on optical fibers. The combination of extremely small probe footprint and absence of metallic parts or interconnnects at the signal pickup area warrant the ultimate RF non-invasiveness. In addition to local field sampling, a [[NeoScan]] system can be configured as a near-field scanning system for mapping aperture-level or device-level field distributions with minimal invasiveness to the antenna or device under test. You can also use a [[NeoScan]] system as a real-time field detection system for sensing and probing electric and magnetic field waveforms in a variety of physical propagation media.
<table><tr><td>{{#ev:youtube|https://www.youtube.com/watch?v=b2Aqrfdrm_E|640|left|<b>VIDEO:</b> A Brief Overview of the NeoScan System.|frame}}</td></tr></table>Â == Key NeoScan System Features ==
Some of the key features of [[NeoScan]] field measurement systems include:
<table><tr><td>{{#ev:youtube|https://www.youtube.com/watch?v=b2Aqrfdrm_E|640|right|<b>VIDEO:</b> A Brief Overview of the NeoScan System.|frame}}</td></tr></table>Â == Customized NeoScan System Configurations ==
[[NeoScan]] systems can be fully customized to meet your most demanding test and evaluation requirements or adapted for various unconventional types of RF measurements. At the present time, EMAG Technologies offers the following four turnkey [[NeoScan]] system configurations:
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[[Image:NEOWEB5NEOWEB5A.png|thumb|left|360px|The NeoScan optical field probe mounted on a precision XY translation stage.]]
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== NeoScan System Applications ==  === Why Measure Fields? === Measurement of electric and magnetic fields has numerous uses and applications in different areas of RF technology. First and foremost, field maps shed light on the physical behavior of RF devices and systems. RF engineers typically use external measurement systems for high frequency characterization. For example, a network analyzer measures the port characteristics of a device. A spectrum analyzer captures the spectral contents of the signals at the input or output of your RF system. Antennas are traditionally characterized by their far field radiation patterns. Such external measurements do not reveal much about how signals, fields and waves evolve, build up and propagate inside a device from one port to another, or out into the free space.  Just as an oscilloscope probe measures voltages and currents at various points of an electronic circuit, imagine if you could measure electric or magnetic fields at any point inside or around a distributed RF system without perturbing them! That's what [[NeoScan]] exactly does for you. <table><tr><td>[[Image:NEOWEB18.png|thumb|left|550px|Measuring the field maps of a planar microstrip bandpass filter in and out of its passband.]]</td></tr><br /table>
=== What Can You Use the NeoScan System For? ===<hr>
The following are a few examples of how you can use the [[NeoScan]] system to measure electric fields in a variety of applications:
*High-resolution near-field scanning/imaging *RF test & characterization*Compact antenna range alternative*RF circuit & device diagnostics*Phase calibration of AESA arrays*Real-time field detection*EMC/EMI testing & certification*Ultra-wideband pulse waveform probing*High-power microwave system evaluation*Field monitoring in medical devices and biological environments*Non-contact, non-invasive, remote field sensing & industrial non-destructive evaluation (NDE)*Simulation model verification & validation (V&V)[[Image:Back_icon.png|40px]] '''[[NeoScan| Back to NeoScan Main Page]]'''