Changes

NeoScan for Antenna Characterization

300 bytes added, 20:30, 19 October 2016
[[File:NeoScan_Product.png|thumb|400px]]
__NOTOC__
[[Image:Back_icon.png|40px]] '''[[NeoScan| Back to NeoScan Main Page]]'''
 
== From Near Fields to Far Fields ==
<tr>
<td>
[[Image:NEOWEB11.png|thumb|420px|NeoScan field probe scanning the surface of a microstrip patch antenna at 2.4GHz349GHz.]]
</td>
</tr>
<tr>
<td>
{{#ev:youtube|https://www.youtube.com/watch?v=sjG2aua-4mk|480550|left|'''VIDEO''': Characterizing an S-band microstrip-fed patch antenna using NeoScan.|frame}}
</td>
</tr>
== One System for Both Near & Far Field Characterization ==
{{#ev:youtube|https://www.youtube.com/watch?v=l5KjauYge5o|380|right|<b>VIDEO</b>: Mapping the near-fields of a 64-element X-band patch antenna array with a corporate feed network.|frame}}
[[NeoScan]]'s non-invasive electro-optic probes have made it possible to directly measure and map the aperture-level fields of a radiating antenna. When dealing with radiating systems, mapping the near fields can have two different purposes. For the purpose of far-field radiation pattern estimation, you don't want to get too close to the surface of the antenna to avoid picking up all the reactive fields and evanescent modes. If you do so, you will need a rather high spatial resolution to capture the field variations with very precise details. On the other hand, for the purpose of diagnostic near-field mapping, you do need a very high spatial resolution and you want to maintain the field probe as close as possible to the surface of the antenna under test. [[NeoScan]] does both jobs for you and meets both sets of requirements with one system and the same probes.
In short, with [[NeoScan]], you get a compact portable self-contained system that characterizes your antenna system from the very near fields to the very far fields without requiring considerable real estate.
<table>
<tr>
<td>
{{#ev:youtube|https://www.youtube.com/watch?v=l5KjauYge5o|550|left|<b>VIDEO</b>: Mapping the near-fields of a 64-element X-band patch antenna array with a corporate feed network.|frame}}
</td>
</tr>
</table>
For instance, you can examine the inter-element coupling effects in passive and active phased arrays. The figure below shows a 64-element fixed-beam X-band patch antenna array with an elaborate micostrip corporate feed network operating at 10.65GHz. The array was designed with a uniform amplitude distribution, <i>i.e.</i>, it should supply equal powers to all the 64 patch radiators.
<tr>
<td>
[[Image:NEOWEB40.png|thumb|left|380px|A 64-element X-band patch antenna array with a corporate feed network operating at 10.65GHz.]]
</td>
<td>
[[Image:NEOWEB43.png|thumb|left|340px|A high-resolution field map of a quarter of the 64-element X-band patch antenna array.]]
</td>
</tr>
</table>
 
As the video shows, the low-resolution near-field maps at a higher height above the array surface provide a good estimate of the far-field radiation patterns, but they do not reveal much about the field distribution of the individual radiating elements. To accomplish the latter, you have to bring the probe down much closer to the radiating aperture. From the figures below, you can easily see that a large portion of the supplied RF power is trapped in the feeding transmission lines, and some patch elements receive much lower power levels than the others.
 
<table>
<tr>
<td>
[[Image:NEOWEB42.png|thumb|left|720px|Low-resolution Ex and Ey field maps of the entire 64-element X-band patch antenna array.]]
</td>
</tr>
<tr>
<td>
[[Image:NEOWEB44.png|thumb|left|720px|Radiation pattern graphs of the 64-element X-band patch antenna array in the principal E and H planes.]]
</td>
</tr>
== A Perfect Solution for Characterizing Ultra-wideband Antenna Systems ==
[[Image:NEOWEB28.png|thumb|360px|Measuring the fields at the aperture of an ultra-wideband ridge horn antenna at 5GHz.]]
Far-field characterization of ultra-wideband antenna systems is a very challenging task. Whether you use an anechoic chamber or a conventional near-field scanning system for this task, you have to utilize different types of metallic antennas with different sizes at different frequency bands in both cases. [[NeoScan]] is inherently an ultra-wideband field measurement system. Its EO field probes have cutoff frequencies well within the terahertz region. It is primarily the RF processing back end of [[NeoScan]] that currently limits its operational bandwidth.
 
<table>
<tr>
<td>
[[Image:NEOWEB28.png|thumb|left|420px|Measuring the fields at the aperture of an ultra-wideband ridge horn antenna at 5GHz.]]
</td>
</tr>
</table>
[[NeoScan]] field probes can measure the aperture field distribution of a wideband antenna over a very large frequency range. However, far-field radiation patterns are frequency domain data by nature. They are measured and visualized at a specified frequency. Several radiation pattern plots are typically generated at different frequency bands to characterize an ultra-wideband antenna system. Using a [[NeoScan]] system for this purpose provides the ultimate convenience of using the same measurement setup, the same AUT positioning and the same field probes to perform near-field scanning at multiple frequency bands. All you need to do is vary the frequency of the RF signal generator that feed the antenna under test.
 
<table>
<tr>
<td>
[[Image:NEOWEB29.png|thumb|left|375px|The aperture field distribution of the ridge horn antenna.]]
</td>
<td>
[[Image:NEOWEB30.png|thumb|left|345px|The far-field radiation pattern of the ridge horn antenna.]]
</td>
</tr>
== A Perfect Solution for Characterizing High-Power Antenna Systems ==
{{#ev:youtube|https://www.youtube.com/watch?v=oAa-XqE9H1g|380|right|<b>VIDEO</b>: Characterizing an X-band slotted waveguide array.| frame}}
Test and evaluation of high-power antenna systems or active phased arrays is a daunting process. Special considerations must be taken into account when measuring high-power radiating systems in an anechoic chamber including operator's safety and fire hazards. The problems are multiplied when using a near-field scanning system whose metallic receiver probe has to be positioned at a far enough distance from the transmitting antenna under test. In contrast, [[NeoScan]] probes can handle field intensities as large as 2MV/m and can even withstand higher radiated power levels. The non-invasive EO probes can be placed very close to the surface of the high-power radiating aperture, while the optical mainframe and RF processing back end reside much farther at a reliable distance from the aperture.
You can use [[NeoScan]] for measurement of different types of antenna structures and array topologies<table><tr><td>{{#ev:youtube|https://www. In certain cases, prior physical knowledge of field distributions may facilitate and expedite the scanning processyoutube. For example, the figure below shows com/watch?v=oAa-XqE9H1g|550|left|<b>VIDEO</b>: Characterizing an X-band slotted waveguide array operating at 9.4GHz. From the physics of such structures, you know that the fields are highly localized close to the centerline of the waveguide array. In addition, the tangential field component parallel to the direction of the slots is zero. Therefore, if the goal of near-field scanning is to compute the far-field radiation patterns, only one tangential field component needs to be mapped. For a complete near-field characterization, however, you may want to measure the normal field maps, too. | frame}}</td></tr></table>
You can use [[NeoScan]] for measurement of different types of antenna structures and array topologies. In certain cases, prior physical knowledge of field distributions may facilitate and expedite the scanning process. For example, the figure below shows an X-band slotted waveguide array operating at 9.42GHz. From the physics of such structures, you know that the fields are highly localized close to the centerline of the waveguide array. In addition, the tangential field component parallel to the direction of the slots is zero. Therefore, if the goal of near-field scanning is to compute the far-field radiation patterns, only one tangential field component needs to be mapped. For a complete near-field characterization, however, you may want to measure the normal field maps, too.
<table>
<tr>
<td>
[[Image:NEOWEB15.png|thumb|left|550px|Measuring the fields at the aperture of an X-band slotted waveguide antenna array at 9.4GHz42GHz.]]
</td>
</tr>
<tr>
<td>
[[Image:NEOWEB8.png|thumb|left|240px|The aperture field distribution of the slotted waveguide array.]]
</td>
<td>
[[Image:NEOWEB16.png|thumb|left|240px|The far-field radiation pattern of the slotted waveguide array.]]
</td>
</tr>
4,622
edits