===Introducing NeoScan===
EMAG Technologies Inc. offers unique, innovative and versatile solutions for your RF test and characterization needs. The NeoScan family of turnkey field measurement systems provide a non-invasive method to detect and probe the electric and magnetic fields generated by your RF devices, antennas or subsystems. They utilize our patented electro-optic and magneto-optic probe technologies to sample and measure electric and magnetic fields without any physical contact, while providing a very large operational bandwidth and a very high spatial resolution.
Unlike conventional near-field scanning systems that require metallic radiators or sensors to pick up the fields, NeoScan probes are made of absolutely metal-free parts. Our field probes feature extremely small optical crystals mounted at the tip of an optical fiber. The combination of small probe footprint and absence of metallic parts or interconnnects at the signal pickup area leads to the ultimate RF non-invasiveness. In addition to fixed-point field sampling, a NeoScan system can also be configured as a near-field scanning system for mapping aperture-level or device-level field distributions with minimal invasiveness to the antenna or device under test. Or it can be used as a real-time field detection system for sensing and detecting electric and magnetic fields in a variety of physical propagation media.