== Product Overview ==
EMAG Technologies Inc. offers the NeoScan family of turnkey field measurement systems. NeoScan systems utilize our unique, patented, electro-optic and magneto-optic probe technologies to detect, sample, measure and scan electric and magnetic fields in a non-invasive manner, while providing a very large operational bandwidth and a very high spatial resolution. The basic NeoScan system uses a non-invasive optical fiber probe to sample the ambient field penetrating the probe's head. The optical beam from a laser source passes through an optical crystal at the probe head, and its polarization state is modulated by the high frequency electric or magnetic field. The reflected optical beam is then demodulated by an optical processing system and measures the modulating electric or magnetic field signal. In addition to basic field measurement at a fixed point in space, NeoScan can also be configured as a near-field scanning system for mapping aperture-level or device-level field distributions with minimal invasiveness to the antenna or device under test. Or it can be used as a real-time field detection system for sensing and detecting electric and magnetic fields in a variety of physical propagation media. Unlike conventional near-field scanning systems that utilize metallic radiators to pick up the fields, NeoScan probes are made up of absolutely non-metallic parts. Our field probes feature extremely small optical crystals mounted at the tip of an optical fiber. The combination of small probe size and absence of metallic parts thus leads to the ultimate RF non-invasiveness. NeoScan systems can be used for a variety of RF test and evaluation applications:
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NeoScan® is a turnkey, electric or magnetic field measurement system. NeoScan systems utilize EMAG's unique, patented, electro-optic (EO) or magneto-optic (MO) field probe technologies. The basic NeoScan system configuration (NeoScan - MSR) uses a non-invasive optical fiber probe to sample and measure the ambient field present at the probe's head. The optical beam from a laser source passes through the optical crystal at the probe head, and its polarization state is modulated by the high frequency electric or magnetic field. The reflected optical beam then passes through an optical processing system and is demodulated. The modulating electric or magnetic field signal is detected by a high frequency photodetector.
In addition to basic field measurement at fixed points in space, NeoScan can also be configured as a near-field scanning system for mapping aperture-level or device-level field distributions with minimal invasiveness to the antenna or device under test. Or it can be used as a real-time field detection system for sensing and detecting electric and magnetic fields in a variety of physical propagation media.
Unlike conventional near-field scanning systems that utilize metallic radiators to pick up the fields, NeoScan probes are absolutely non-metallic, and their operation is based on electro-optic (EO) or magneto-optic (MO) effects. Our field probes feature extremely small EO or MO crystals mounted at the tip of an optical fiber. The combination of small probe size and absence of metallic parts thus leads to the ultimate RF non-invasiveness.
NeoScan provides detailed field maps of passive and active devices and circuits including RFIC's and MMIC's. Such invaluable information can effectively be used for design validation, model verification, fault isolation or performance evaluation of various parts of your RF system.
== A Unique Test & Evaluation Capability ==
