*Vectorial field measurement with very high cross-polarization suppression
*Very wide dynamic range (>70dB) from very low field intensities under 1V/m to extremely high field intensities above 2MV/m
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== Understanding Your RF Design Through Field Maps ==
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Measurement of electric and magnetic fields has numerous uses and applications in different areas of RF technology. First and foremost, field maps shed light on the physical behavior of RF devices and systems. RF engineers typically use external measurement systems for high frequency characterization. For example, a network analyzer measures the port characteristics of a device. Antennas are usually characterized by their far field radiation patterns. Such external measurements do not reveal much about how signals, fields and waves evolve, build up and propagate inside a device from one port to another, or out into the free space. Just as an oscilloscope probe measures voltages and currents at various points of an electronic circuit, imagine if you could measure electric or magnetic fields at any point inside or around a distributed RF system! That's what NeoScan exactly does for you.
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== Non-Invasive Ultra-Near-Field Scanning ==
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One of the most unique features of the NeoScan system is the very small size of its field probes and the absence of any metallic parts at the probe tip. As a result, you can position a NeoScan field probe very close to the device under test without perturbing the ambient electric or magnetic fields. When mounted on a computer-controlled XY positioner, the probe can scan the surface of your device and create a field map in real time. You can generate maps of the tangential and normal components of the field displaying the amplitude and phase of the respective field components at all the scanned points.
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<table>
<tr>
<td>
[[Image:NEOWEB6.png|thumb|550px|Modulating the polarization state of an optical beam passing through an electro-optic crystal.]]
</td>
</tr>
<tr>
<td>
[[Image:NEOWEB14.png|thumb|550px|Modulating the polarization state of an optical beam passing through an electro-optic crystal.]]
</td>
</tr>
</table>
== Electro-Optic (EO) Effect ==
Using these measured field profiles, one can compute all the other secondary quantities of interest. You can use our field maps as an effective means of verification and validation (V&V) of your modeling and simulation tools. Similarly, you can use our electromagnetic analysis tools to verify and validate the field measurement results.
== Understanding Your RF Design Through Field Maps ==
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[[Image:NEOWEB15.png|thumb|550px|Modulating the polarization state of an optical beam passing through an electro-optic crystal.]]
[[Image:NEOWEB16.png|thumb|550px|Modulating the polarization state of an optical beam passing through an electro-optic crystal.]]
Measurement of electric and magnetic fields has numerous uses and applications in different areas of RF technology. First and foremost, field maps shed light on the physical behavior of RF devices and systems. RF engineers typically use external measurement systems for high frequency characterization. For example, a network analyzer measures the port characteristics of a device. Antennas are usually characterized by their far field radiation patterns. Such external measurements do not reveal much about how signals, fields and waves evolve, build up and propagate inside a device from one port to another, or out into the free space. Just as an oscilloscope probe measures voltages and currents at various points of an electronic circuit, imagine if you could measure electric or magnetic fields at any point inside or around a distributed RF system! That's what NeoScan exactly does for you.
Â
== Non-Invasive Ultra-Near-Field Scanning ==
Â
One of the most unique features of the NeoScan system is the very small size of its field probes and the absence of any metallic parts at the probe tip. As a result, you can position a NeoScan field probe very close to the device under test without perturbing the ambient electric or magnetic fields. When mounted on a computer-controlled XY positioner, the probe can scan the surface of your device and create a field map in real time. You can generate maps of the tangential and normal components of the field displaying the amplitude and phase of the respective field components at all the scanned points.
Â
<table>
<tr>
<td>
[[Image:NEOWEB6.png|thumb|550px|Modulating the polarization state of an optical beam passing through an electro-optic crystal.]]
</td>
</tr>
<tr>
<td>
[[Image:NEOWEB14.png|thumb|550px|Modulating the polarization state of an optical beam passing through an electro-optic crystal.]]
</td>
</tr>
</table>
== A Low-Cost Alternative to Costly Anechoic Chambers and Much More... ==