We offer comprehensive test and characterization services for RF, microwave and millimeter wave antennas, circuits and systems. Our laboratories are equipped with state-of-the-art high frequency circuit and antenna measurement systems covering up to 67GHz including:

• Agilent E8361A PNA Series Vector Network Analyzer (VNA) and other VNAs, spectrum analyzers, signal generators and digital oscilloscopes
• Cascade probe station with on-wafer measurement capability up to 67 GHz
• Computer-controlled anechoic chamber validated according to CISPR 16-1-4 Amendment 1 Normalized Site Attenuation (NSA) requirements
• Screened chamber (Faraday Cage) for electromagnetic interference (EMI) and electromagnetic compatibility (EMC) testing
• Temperature-controlled chamber for thermal testing and cycling

We provide RF characterization and measurement services at higher frequencies up to 110GHz as well as outdoor range testing services off-site through local facilities. Near field imaging of RF circuits and antennas at HF-W bands using an electro-optic mapping system is also available through our spin-off company Opteos, Inc.